Olympus EPOCH 650 - Adjusting the interface gate; Setting the Material Velocity

DMTA-10055-01EN, Rev. A, February 2015
Chapter 11 260
Figure 11-24 The Inspect mode
Crack sizes are displayed under the “Di” measurement (see “Reading Setup Page” on
page 91).
With the Peak Memory function active, the EPOCH 650 defaults to Envelope mode for
crack sizing. Use the following steps to size a crack using Envelope mode.
To size a crack using Envelope mode
1. Press PEAK MEM to activate the Peak Memory function.
2. Find the signal from the potential defect and bring to maximum amplitude (see
API’s Recommended Practice 5UE for crack scanning and inspection
requirements).
3. If necessary, press 2
ND
F, (AUTO XX%) to bring the peak amplitude to 80 % of FSH.
4. Scan forward and backward from the peak amplitude of the crack to draw a
“peak envelope” of the crack signal.
5. Adjust your screen range to adequately encompass the entire peak envelope, and
then set the gate level to less than half the peak amplitude height (in % FSH).
6. Press P1 to collect A
max
, T
1
, and T
2
from the peak envelope.