Renesas H8 Series - Page 268

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18) Test Parallel Access :
A) Internal ROM Parallel Read Access(WORD) ...........OK
B) Internal ROM Parallel Write Access(WORD) ..........OK
C) Internal ROM Parallel Write Access(High Byte) .....OK
D) Internal ROM Parallel Write Access(Low Byte) ......OK
E) Internal RAM Parallel Read Access(WORD) ...........OK
F) Internal RAM Parallel Write Access(WORD) ..........OK
G) Internal RAM Parallel Write Access(High Byte) .....OK
H) Internal RAM Parallel Write Access(Low Byte) ......OK
I) Option RAM Parallel Read Access(WORD) .............RESERVED
J) Option RAM Parallel Write Access(WORD) ............RESERVED
K) Option RAM Parallel Write Access(High Byte) .......RESERVED
L) Option RAM Parallel Write Access(Low Byte) ........RESERVED
Shows the check results
for the parallel access
controlling circuits in
the E6000 (normal
completion).
19) Test Go Reset:
A) Go Reset................................OK
B) Bus 00>FF...............................OK
Shows the check results
for the Go RESET
controlling circuits in
the E6000 (normal
completion).
20) Test Normal Mode:
A) Normal Mode Test .......................OK
B) Address 23:16=00 Test ..................OK
Shows the check results
for Normal Mode (normal
completion).
Tests run for xH:xM:xxS Total testing time.
Tests passed, emulator functioning correctly Shows that the E6000 is
correctly operating.