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5.7 Using the Event Points
The emulator has the event point function that performs breaking, tracing, and execution time measurement by
specifying higher-level conditions along with the software breakpoints standard for the High-performance
Embedded Workshop.
5.7.1 Software Breakpoints
When the instruction of the specified address is fetched, the user program is stopped. Up to 256 points can be set.
Note that, however, only one software breakpoint can be set in the ROM area of the user system. This particular
breakpoint is called the on-chip breakpoint, which stops the user program after executing the instruction of the
specified address.
When it is necessary to set two or more software breakpoints to the external ROM area of the user system,
allocate this area to the emulation memory, copy the code, and then set the software breakpoints.
5.7.2 Event Points
Event points can be used for higher-level conditions such as the data condition as well as specification of the
single address. Up to 12 event points can be set by using event channels and range channels in the event
detection system.
When the condition is satisfied, event points are also used as the start/end conditions for execution time
measurement or trace acquisition in addition to halting the user program. Several event points can be used to set
more complex conditions.
Note: Event points acquire the data, test conditions, and execute an action (such as halting the user program)
by the hardware circuit of the emulator. Therefore, a delay of several cycles will occur from the
satisfaction of the condition to the execution of an action.
5.7.3 Event Detection System
In addition to the 4 range channels, the emulator also has 8 event channels. The event channels have more
functions (such as sequencing or counting) than the range channels.
Event Channels (Ch1 to Ch8):
The emulator has 8 event channels. The event channel can be defined as a combination of one or more of the
followings:
• An address or an address range
• Outside of an address range
• A read, a write, or either
• Data with a mask specification
• Bus state
• Area
• The value of four external probe signals
• The number of times the event has occurred
• The number of delay cycles after the event has occurred
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