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Schweitzer Engineering Laboratories SEL-352-1 - Page 322

Schweitzer Engineering Laboratories SEL-352-1
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ii Testing and Troubleshooting Date Code 20010731
SEL-352-1, -2 Instruction Manual
Lockout Relay Control, Scheme 2 Logic Test ......................................................................... 11-39
Serial Ports Test........................................................................................................................ 11-41
IRIG-B Time-Code Input Test ................................................................................................. 11-41
Power Supply Voltages Test .................................................................................................... 11-41
Calibration ................................................................................................................................ 11-42
Troubleshooting........................................................................................................................ 11-42
Inspection Procedure ........................................................................................................ 11-42
Troubleshooting Table...................................................................................................... 11-42
All Front-Panel LEDs Dark ...................................................................................... 11-42
System Does Not Respond to Commands ................................................................ 11-42
Tripping Output Relay Remains Closed Following Fault ........................................ 11-43
No Prompting Message Issued to Terminal Upon Power Up .................................. 11-43
System Does Not Respond to Faults ........................................................................ 11-43
Time Command Displays the Same Time for Successive Commands .................... 11-43
Terminal Displays Meaningless Characters ............................................................. 11-43
"SELBOOT" on LCD Display and Serial Port Warning to Remove Jumper (at
power-up).......................................................................................................... 11-43
Self-Test Failure: +5 V ............................................................................................ 11-43
Self-Test Failure: +15 V .......................................................................................... 11-43
Self-Test Failure: –15 V .......................................................................................... 11-44
Self-Test Failure: Offset .......................................................................................... 11-44
Self-Test Failure: ROM ........................................................................................... 11-44
Self-Test Failure: RAM ........................................................................................... 11-44
Self-Test Failure: CR_RAM.................................................................................... 11-44
Self-Test Failure: A/D Converter ............................................................................ 11-44
Self-Test Failure: IO_BRD...................................................................................... 11-44
Self-Test Failure: CR_RAM, EEPROM, and IO_BRD .......................................... 11-44
Alarm Contacts Closed ............................................................................................. 11-44
Self-Test Failure: Temp After R_S Command........................................................ 11-45
Factory Assistance.................................................................................................................... 11-45
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Figure 11.1: Low-Level Test Interface................................................................................................... 11-3
Figure 11.2: Relay Part Number and Hardware Identification Sticker .................................................. 11-4
Figure 11.3: Test Connections With Three-Phase Voltage and Three-Phase Current Sources ............. 11-7
Figure 11.4: Test Connections With Three-Phase Voltage and Two-Phase Current Sources ............... 11-8

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