11-36 Testing and Troubleshooting Date Code 20010731
SEL-352-1, -2 Instruction Manual
SYNCHRONISM CLOSE LOGIC TEST
Purpose: Verify the synchronism portion of the controlled close logic (Reference: Figure 4.4,
Figure 4.5).
Method: 1. While the relay can use two different closing schemes, only one is enabled at a
time. Select Scheme 2 by setting CLSLOG = 2 in the relay setting group. Using
the SET R command, set the SER to trigger for the listed elements. Using the
SET command, set an output contact to CCA. Verify the settings with the SHO
commands.
Setting
Elements
CLSLOG, 59L,
CLSdo, SYNCdo,
TRIPA, CLOSE,
MCLOSE
CCA, TRIPA, X59L3, Y59L3, 25M, 25C,
CLOSE, MCLOSE, SYNCTD, MCTD
2. Connect a timer to start timing when the output contact programmed in Step 1
closes and stop when the output contact opens again.
3. Assert the MCLOSE input to initiate a manual close condition.
4. Verify the timer reading is approximately the CLSdo setting.
5. Apply 67 V to VAX and VAY.
6. Assert the CLOSE input to indicate an automatic synchronous close condition.
7. Assert the MCLOSE input to indicate a manual synchronous close condition.
8. For each test, the relay generated a sequential events record for the elements
programmed in Step 1. View the SER using the SER command. The SYNCdo
timer setting is the time from SYNCTD assertion to SYNCTD deassertion for all
CLOSE operations. The MCLOSE operations use the MCTD bit that is the output
of the fixed 2-cycle MCT timer.
TRAPPED CHARGE DETECTION LOGIC TEST
Purpose: Verify the trapped charge detection logic (Reference: Figure 4.6).
Method: At this time, the only method for testing the trapped charge detection logic is to replay
actual system conditions through test equipment such as the SEL-AMS. The
SEL-RTS Relay Test System includes an SEL-AMS and uses a COMTRADE format
for data input. Contact a customer service representative for more information.