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Schweitzer Engineering Laboratories SEL-352-1 - Alarm Contacts Closed; Self-Test Failure: A;D Converter; Self-Test Failure: CR_RAM; Self-Test Failure: CR_RAM, EEPROM, and IO_BRD

Schweitzer Engineering Laboratories SEL-352-1
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11-44 Testing and Troubleshooting Date Code 20010731
SEL-352-1, -2 Instruction Manual
Self-Test Failure: –15 V
1. Power supply 15 V output out-of-tolerance. See STATUS command.
2. A/D converter failure.
Self-Test Failure: Offset
1. Offset drift.
2. A/D converter drift.
3. Loose ribbon cable between transformers and main board.
Self-Test Failure: ROM
1. Memory failure. Contact the factory.
Self-Test Failure: RAM
1. Failure of static RAM IC. Contact the factory.
Self-Test Failure: CR_RAM
1. If an R_S or saving settings process was interrupted by loss of power or CTRL-X, issue the
R_S command again. Settings will return to factory defaults.
2. If cause of the CR_RAM is unknown, contact the factory.
Self-Test Failure: A/D Converter
1. A/D converter failure.
2. RAM error not detected by RAM test.
Self-Test Failure: IO_BRD
1. I/O board has been changed. Execute the INITIO command.
2. Ribbon cable disconnected between I/O board and main board. Reconnect and execute
INITIO command.
3. Interface Board Failure.
Self-Test Failure: CR_RAM, EEPROM, and IO_BRD
1. Self-test detected setting location movement due to flash firmware upgrade. Execute R_S
command.
2. Main board failure, contact the factory.
Alarm Contacts Closed
1. Power is off.
2. Blown fuse.
3. Power supply failure.
4. Main board or interface board failure.
5. Other self-test failure.

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