Date Code 20080110 Testing and Troubleshooting 10-13
SEL-387E Instruction Manual
Table 10.1: Instantaneous Overcurrent Elements and Corresponding Settings
Winding 1 Winding 2 Winding 3
Bit Setting Bit Setting Bit Setting
Phase Level 1 50P11 50P11P 50P21 50P21P 50P31 50P31P
Phase Level 2 50P12 50P12P 50P22 50P22P 50P32 50P32P
Phase Inverse-Time 51P1 51P1P 51P2 51P2P 51P3 51P3P
A-Phase Level 3 50A13 50P13P 50A23 50P23P 50A33 50P33P
B-Phase Level 3 50B13 50B23 50B33
C-Phase Level 3 50C13 50C23 50C33
Phase Level 3 50P13 50P23 50P33
A-Phase Level 4 50A14 50P14P 50A24 50P24P 50A34 50P34P
B-Phase Level 4 50B14 50B24 50B34
C-Phase Level 4 50C14 50C24 50C34
Phase Level 4 50P14 50P24 50P34
Residual Level 1 50N11 50N11P 50N21 50N21P 50N31 50N31P
Residual Level 2 50N12 50N12P 50N22 50N22P 50N32 50N32P
Residual Inverse-Time 51N1 51N1P 51N2 51N2P 51N3 51N3P
Neg-Seq Level 1 50Q11 50Q11P 50Q21 50Q21P 50Q31 50Q31P
Neg-Seq Level 2 50Q12 50Q12P 50Q22 50Q22P 50Q32 50Q32P
Neg-Seq Inverse-Time 51Q1 51Q1P 51Q2 51Q2P 51Q3 51Q3P
Definite-Time and Inverse-Time Overcurrent Elements
Note:
This example tests the Winding 1 51P1 phase inverse-time overcurrent element. Use the
same procedure to test all definite-time and inverse-time overcurrent elements for each
winding.
Step 1.
Purpose: Determine the expected time delay for the overcurrent element.
Method: 1. Execute the
SHOWSET
command via the relay front panel or serial
port and verify the time delay settings (i.e.,
SHO 51P1 <Enter>
).
The delay settings will follow the pickup settings when they are
displayed.
2. Calculate the time delay to pickup (tp). Definite-time elements will
be equal to the delay setting (i.e., 50P11D setting for the 50P11
element). Inverse-time elements are calculated using three element
settings and the operating time equations shown in
Section 3:
Protection Functions
. TD is the time-dial setting (i.e., 51P1TD), and
M is the applied multiple of pickup current.
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