HP 54620A - Page 234

removing
and replacing assemblies, 181
cabinet, 182
display, 185
fan, 183
front panel, 184
handle, 189
keyboard, 188
power supply, 187
system board, 186
removing probe leads, 43
repetitive acquisition
concepts of behavior, 131
repetitive waveforms
and edge trigger, 65
replaceable parts, 180
descriptions and part numbers, 193
exploded view, 192
list for analyzer, 193
ordering, 191–194
using the mail order system, 191–194
replaceable parts list, 193
replacement
list, 193
reset setup, 119
resetting the analyzer, 123
resistance of impedance, 139–142
resistors
for dummy load, 158
for test connectors, 156–157
restore
configuration, 113
default configuration, 113
results
accumulating, 58
where displayed, 41
results of tests
record in Performance Test Record, 178
reversing Autoscale, 44–45
ribbon cable
disconnect to remove display, 185
disconnect to remove front panel, 184
disconnect to remove power supply, 187
disconnect to remove system board, 186
for LVPS, 166
Right
time reference position, 83–85
ringing in voltage model, 141
risetime in voltage model, 141
ROM and RAM self-tests, 151–152
RS-232 Interface module, 111
Run, 46
and auto trigger, 71, 131
and Erase, 58
and trigger, 65
run mode
and acquisition process, 70–71
run self-tests, 152–154
S
safety certification, 204–206
safety summary
read before servicing, 181
sample period
relationship to sweep speed, 48
varied as function of timebase, 129–138
sampling, 55
sampling intervals, 130
affect delay value, 133
sampling period, 39
affects measurement results, 137
sampling rate
increase to capture glitch, 144
insufficient to capture glitch, 144
reasons to increase, 145
sufficient for display, 147
save
configuration, 112–113
setup, 117
waveform, 112, 114
screen
erasing, 58
searching for trigger, 70–71
Select knob, 37, 50, 73
choosing edge trigger channel, 47, 72
using to select channels, 49
selecting
channels, 49–50
channels for pattern trigger, 73
time reference position, 83–85
self-tests, 27, 151
acquisition system, 154
display, 162–163
keyboard, 153–154
ROM and RAM, 152
run to check LVPS, 167
sequential output patterns
triggering on, 77
setting
cursor position, 91
DC offset for threshold test, 172
threshold voltages, 108
Time/div, 48
setting trigger condition
for external trigger input, 110
for trigger output, 110
setting up external trigger, 108
setting up function generator, 170, 175
setting up pattern trigger, 73
setting up pulse generator, 175
setting up the analyzer, 21
to test time interval accuracy, 176
settings
default configuration, 119
for graticule, 81, 87
of cursor readouts, 95
setup
factory default, 44–45
memory banner, 117–118
message, 213–214
recalling, 118
recalling after trace cleared, 116
recalling from memory, 115
reset, 119
saved when trace cleared, 116
saving to memory, 117
setup functions
performance characteristics, 203
setup memory, 111–112
save/recall, 113
softkey menu, 113
setup time, 100–101
measurement, 101
shielding, magnetic, 24–26
shipment, damaged
See damaged shipment
shorting probes, 42–43
shutdown
occurs when LVPS is too hot, 167
signal margin on external trigger, 109
signals
on system board, 166
Single, 56
and auto trigger, 71, 131
Index
233