HP 54620A - Page 235

single-channel measurements, 94–97
calculation and values, 91
softkeys displayed, 91
where displayed, 41
single-shot acquisition, 56, 71, 132
concepts of behavior, 131
size
display, 163
of glitch captured, 143–148
skew
check with channel-to-channel delay,
98–99
softkey labels, 38, 41
softkeys, 37, 41
Adv, 69, 74–79
edge trigger, 47, 72
for setup memory, 113
for trace memory, 112
Label, 59–64
Logic levels, 54
Mode, 70–71
On/Off, 49
Pattern, 73
software
Benchlink for Microsoft Windows, 24–26
solutions to problems
channels, 125
trace display, 123–124
solving problems
See Testing and Troubleshooting chapter
sources
for trigger, 74–79
defining patterns and edges, 74
for trigger, 75
specifications
of service equipment, 164
performance, 196
threshold accuracy, 169
start channel, 98–99
and edge, 92
start delay measurement, 92
starting an acquisition, 46
state machine
triggering on outputs, 77
status indicators, 38–39
STORE, 58
status messages
where displayed, 41
Stop, 46
stop printing, 88
stopping an acquisition, 46
to increase trigger output rate, 107, 110
storage, 56
and Autostore, 58
sub bright, 163
supplied accessories
See accessories, supplied
sweep
adjusting, 93
sweep displays
delayed, 80–81
main, 81
sweep speed, 39
affects acquisition memory, 130
affects sampling interval, 130
and missed trigger, 71, 131
increase to achieve accuracy, 137
reasons to increase, 145
relationship to instrument operating
parameters, 48
slower affects memory fill, 137
See also timebase
switch
power, 187
synchronizing display to circuit, 65
system board
removing, 186
replacing/exchanging, 190
signals, 166
system failure
example of triggering on, 78
T
t1 and t2 cursors, 89, 94–95
temperature
warm up, 159
test accessories
building, 155
test configurations
saving, 117
saving and recalling, 112
test connectors, 156–157
order for dummy load, 158
test ports, design in, 142
test results
record in Performance Test Record, 178
test setup
for thresholds, 171
for time interval accuracy, 174
test thresholds, 172
testing
the analyzer, 150
threshold accuracy, 169
time interval accuracy, 173
tests
acquisition system, 154
built into the analyzer, 151
keyboard, 153–154
ROM and RAM, 152
things to check
fan running?, 167
for channel problems, 125
for trace display problems, 123–124
LVPS voltages, 165–167
Performance Test Record, 169
signals on system board, 166
threshold, 55
accuracy, 169
test settings, 172
test setup, 171
threshold tests
using test accessories, 155
threshold voltage
setting, 54
threshold voltages
for external trigger input, 108
setting, 53
thresholds
message, 214
preset configuration, 119
time interval
of auto trigger, 70, 131
time interval accuracy test
acquiring data, 177
connecting equipment for, 174
setting up analyzer, 176
setting up equipment, 175
time interval tests
using test accessories, 155
time readout, 94–95
time reference
adjusting delay, 86
example, 134
setting position of, 83–85
Index
234