Table continued from the previous page...
Field Function
TEST X= Test-mode selection.
NOTE: Unlike all other DUTCFG bits, TEST_SEL_B is always driven.
3.53 DUT Configuration 6 (DUTCFG6)
Address
Register Offset
DUTCFG6 066h
Function
The DUTCFG6 register is used to sample device-specific test modes.
Diagram
Bits
7 6 5 4 3 2 1 0
R
SOC
W
RRST
1 111111 SW3[4]
Fields
Field Function
7
-
Reserved.
6-1
-
Reserved.
0
SOC
Controls cfg_soc_use.
1= Default.
3.54 DUT Configuration 11 (DUTCFG11)
Address
Register Offset
DUTCFG11 06Bh
NXP Semiconductors
Qixis Programming Model
QorIQ LX2160A Reference Design Board Reference Manual, Rev. 4, 07/2020
Reference Manual 100 / 116
To Next Page
Loading...
