AT&T PC 6300 - Keyboard Test

DIAGNOSTICS
Bus Noise Test: This test exercises the memory address and
data buses. This test fills the memory with a pattern and then
checks it. This is repeated using all 24 fixed patterns. This entire
sequence is then repeated 8 times.
Parity Circuit Test; This test checks the parity generation and
checking circuitry. It has not yet been included in the System Test
Diagnostics.
Keyboard Test
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Refresh Test: This test first writes a zero pattern to all banks
under test. The test then delays 10 seconds and verifies that all
memory locations still contain the zero pattern. This is repeated ^
using an FFFF pattern. This test verifies that the RAM memory j |
is being correctly refreshed by the display circuitry.
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The Keyboard internal hardware is first tested and then a graphic
representation of the Keyboard layout is displayed. This layout
display is used to manually test the individual keys. The LEDs On
the keyboard will blink while the keyboard is being tested. During
this phase, the test is capable of detecting and locating stuck keys.
A stuck key is located by means of the scan code displayed in the
error messages (see error messages for Keyboard test 400). The
next phase of the test consists of manually testing each key on the
keyboard. Proper operation is indicated on the displayed keyboard. _
If any key does not function properly, you are asked to press j
CTRL and 0 (numeric key pad 0), and the error message is then
displayed. If the test was successful, you are asked to press CTRL
and 1 (numeric key pad 1) to proceed with other tests. The PI
keyboard display test is only run if you choose to execute each test (
only once in MENU A.
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