Zeiss Axio Imager 2 - Page 29

Axio Imager 2 INSTRUMENT DESCRIPTION ZEISS
Stage micrometers and eyepiece reticles
01/2016 430000-7544-001 29
Symbol Designation, technical data Cat. No.
Universal calibration slide D=0
Without cover glass; positive version
− Precision retrieval of objects
− Location of the reference mark relative to the
left and
− upper edge of specimen slide X = 38 mm /
Y = 13 mm, ± 5 µm
− 50mm line for parallelism check
− Stage micrometer-function "Micro" and
"Stemi":
− 5 lines at 1 mm intervals in y direction
− 100 lines at 1/100 mm intervals in y
direction
− 25 lines at 1 mm intervals in x direction
− 50 lines at 1/10 mm intervals in x direction
− Circular areas with diameter of
2.5/1.0/0.5/0.1/0.05/0.01 mm
− Concentric rectangles 8x6/4x3/2x1.5/
1x0.75 mm
474029-9010-000
Crossline micrometer 14:140 / d = 26 mm
Graduation length = 14 mm
Increments = 0.1 mm
Graduation tolerance ≤ 0.001 mm
454060-0000-000
Eyepiece reticle / d = 26 mm
For the alignment of the reticle using alignment
specimen.
474064-0000-000
Crossline micrometer 10:100 / d = 26 mm
Graduation length = 10 mm
Increments = 0.1 mm
Graduation tolerance ≤ 0.001 mm
474066-9901-000