Appendix
13.1 Automatic test procedures
5284 / 08/2023 en BENNING ST 755+ / ST 760+ 105
Testno. Name Individual tests
5 Devices of ClassII without R
Insu
+
I
Cont dir.
I
Cont
(dir.), functional test with I
Cont
(differential
current measuring method)
6 Devices of ClassII with U output R
Insu-3
(500V), functional test with I
Cont
(differential current measuring method), U
a
(at
secondary output)
Table32: Test procedures according to EN50678 (VDE0701) and EN50699 (VDE0702) for ClassII
Testno. Name Individual tests
1 Devices of ClassIII R
Insu‑3
(500V), U
a
(at secondary output)
Table33: Test procedures according to EN50678 (VDE0701) and EN50699 (VDE0702) for ClassIII
Test/ test
no.
1 2 3 4 5 6 1
Protection
class
ClassII ClassIII
Visual
inspection
X X X X X X X
Connection
test
X X X X X X X
R
Insu-1
/ R
Insu‑IN
X X X - - - -
R
Insu-3
- - - - - X X
I
Cont
- X - - X - -
Funct. X - X X X X -
U
a
- - - - - X X
Table34: Overview of test procedures according to EN50678 (VDE0701) and EN50699 (VDE0702) for
ClassII (1to 6)/ ClassIII (1)
13.1.2 Automatic test procedures according to EN62353
(VDE0751-1)
Testno. Name Individual tests
1 Medical devices of ClassI R
PE
(600mA), R
Insu‑1
(500V), functional test with
I
Leak
(differential current measuring method)
2 Medical devices of ClassI without
R
Insu
R
PE
(600mA), functional test with I
Leak
(differential current measuring method)
3 Med. devices of ClassI typeBF R
PE
(600mA), R
Insu‑1
(500V), R
Insu‑2
(250V),
R
Insu‑3
(500V), I
Leak
(diff.),
I
PLeak
(alt., typeBF), functional test with I
Leak
(diff.)
4 Med. devices of ClassI typeCF R
PE
(600mA), R
Insu‑1
(500V), R
Insu‑2
(250V),
R
Insu‑3
(500V), ILeak (diff.),
I
PLeak
(alt., typeCF), functional test with I
Leak
(diff.)
5 Med. devices of ClassI typeB R
PE
(600mA), R
Insu‑1
(500V), R
Insu‑2
(250V),
R
Insu‑3
(500V), I
Leak
(diff.),
I
PLeak
(alt., typeB), functional test with I
Leak
(dir.)
Table35: Test procedures according to EN62353 (VDE0751‑1) for ClassI