Benning ST 755+ - Testing the Device Leakage Current; Figure 19 Testing the Device Leakage Current (Connection Diagram for VDE 0751-1, Circuit Diagram)

9.5 Individual tests
Testing
5284 / 08/2023 enBENNING ST 755+ / ST 760+86
9.5.5 Testing the device leakage current
The device leakage current test [}page44] is intended to check medical electrical devices of
protection classesIandII for proper insulation capacity at mains voltage. This is to ensure that
no leakage current flows from the active components, the housing or accessible conductive
components to earth and that there is no risk of a dangerous electric flow via accessible
conductive components.
Requirements
• Approved safety measuring lines
• Please observe the requirements for measuring [}page71].
• The test sample is disconnected from the mains.
• Make sure that you are familiar with the procedure for manual [}page77] and automatic
[}page76] testing.
• The test sample has passed the protective conductor resistance test [}page79].
• Make sure that you know the necessary measuring points.
• The test sample has passed the insulating resistance test [}page80].
• The measuring circuit of the setup must be closed.
• The test sample is connected according to the connection diagram.
1 2
3
Figure19: Testing the device leakage current (connection diagram for VDE0751-1, circuit diagram)
1 Direct current measuring method (ClassI, I
Leak
)
The shock-proof plug of the test sample is plugged into the test socket of the device.
Use the test probe for measuring on all accessible conductive components and applied
parts of the test sample.
2 Differential current measuring method (ClassI, I
Leak
)
The shock-proof plug of the test sample is plugged into the test socket of the device.
Use the test probe for measuring on all accessible conductive components and applied
parts of the test sample.
3 Alternative leakage current measuring method (ClassI, I
Leak
)
The shock-proof plug of the test sample is plugged into the test socket of the device.
Use the test probe for measuring on all accessible conductive components and applied
parts of the test sample.