Benning ST 755+ - Factory Settings and Measured Values - Safety Extra-Low Voltage Test; Factory Settings and Measured Values - PRCD Test; Table 58 Measured Values According to Measuring Specifications - Cable Continuity Test; Table 59 Measured Values According to Measuring Specifications - Safety Extra-Low Voltage Test

Appendix
13.4 Factory settings and measured values
5284 / 08/2023 en BENNING ST 755+ / ST 760+ 115
Parameter Value
Measuring range 0.05... 10Ω
Resolution 0.001Ω
Accuracy ±15% of the measured value
Measuring voltage U
0
approx. 8V‑AC
Table58: Measured values according to measuring specifications– Cable continuity test
13.4.6 Factory settings and measured values– Safety extra-
low voltage test
Parameter Value
Measuring range 1.0... 360V‑DC, 250V‑AC
Resolution 0.1V
Accuracy ±15% of the measured value
Table59: Measured values according to measuring specifications– Safety extra-low voltage test
13.4.7 Factory settings and measured values– PRCD test
Parameter Value Unit
Tripping current Inom. 30 mA
Tripping time 1xInom. 300 ms
Tripping time 5xInom. 40 ms
Tripping time ½xInom. 300 ms
Table60: Factory settings of the limits for PRCD-AC
Parameter Value Unit
Tripping current Inom. 42 mA
Tripping time 1xInom. 300 ms
Tripping time 5xInom. 40 ms
Max. contact voltage 35 V
Table61: Factory settings of the limits for PRCD-A und PRCD-F
Parameter Value Unit
Tripping current Inom. 60 mA
Tripping time 1xInom. 300 ms
Tripping time 5xInom. 40 ms
Max. contact voltage 50 V
Table62: Factory settings of the limits for PRCD-B und PRCD-B+
Parameter Value Unit
Tripping current Inom. 30 mA
Tripping time 1xInom. 300 ms
Tripping time 5xInom. 40 ms
Max. contact voltage 25 V
Table63: Factory settings of the limits for PRCD 2-pin, 3-pin, K, S and S+
Parameter Value
Testing current 0… 100mA, 100…1 000mA