SICK nanoScan3 - Testing plan

Available data:
•
St
atus of safety function
•
Status sleep mode
•
Contamination warning
•
Contamination error
•
Reference contour monitoring
•
Manipulation
•
Cut-off path (safety-oriented)
•
Cut-off path (Not safety-related)
•
Current monitoring case
•
Reset required
•
Application error
•
Device error
Assembly 113: output of the device, input of the control
•
CIP S
afety
•
Update cycle: 5 ms (or a multiple of this, depending on RPI)
•
Length: 16 bytes
Available data:
•
Status of safety function
•
Status sleep mode
•
Contamination warning
•
Contamination error
•
Reference contour monitoring
•
Manipulation
•
Cut-off path (safety-oriented)
•
Cut-off path (Not safety-related)
•
Current monitoring case
•
Reset required
•
Application error
•
Device error
Assembly 120: output of the device, input of the control (not safety-related)
•
CIP
•
U
pdate cycle: 5 ms (or a multiple of this, depending on RPI)
•
Length: 12 bytes
•
For automation and diagnostic tasks without safety implication
Available data:
•
Status of safety function
•
Status sleep mode
•
Contamination warning
•
Contamination error
•
Reference contour monitoring
•
Manipulation
•
Cut-off path (Not safety-related)
•
Reset required
•
Current monitoring case
•
Application error
•
Device error
4.6 Testing plan
The manufacturer of the machine and the operating entity must define all required
t
horough checks. The definition must be based on the application conditions and the
risk assessment and must be documented in a traceable manner.
4 PROJECT PLANNING
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O P E R A T I N G I N S T R U C T I O N S | nanoScan3 – EtherNet/IP™ 8027909/2023-02-22 | SICK
Subject to change without notice