Anritsu MT8801C - Page 249

Section 6 Peformance Tests
6-6
(4) Procedure
Agin rate: Test this at an ambient temperature change less than ±2˚C in a vibra-
tion-free place.
Step Procedure
1. Set the reference signal changeover switch (FREQ STD:INT/EXT) on the MF1603A rear panel to
EXT.
2. Set the power supply switch on the MT8801C rear panel to On. Then, set the Power switch on the
MT8801C front panel to On.
3. Measure the frequency of the output from the 10 MHz Reference Buffered Out connector using the
MF1603A after 24-hour operation with 0.1 Hz digit resolution.
4. Measure the frequency of the same output using the MF1603A after 24 hours from the
measurement in step 3.
5. Calculate the stability using the following equation
Frequency stability=
(MF1603A reading in step 4) – (MF1603A reading in step 3)
(MF1603A reading in step 3)
Temperature stability: Test this in a vibration-free constant-temperature chamber.
Step Procedure
1. Set up the MT8801C in a constant-temperature chamber at 25°C.
2. Set the Power switches on the MT8801C rear and front panels to On, and wait until the MT8801C
internal temperature stabilizes, and wait approx. 1.5 hours after the chamber temperature stabilizes.
3. When the internal temperature stabilizes, measure the frequency of the output from the 10 MHz
Reference Buffered Out connector of the MT8801C using the MF1603A with 0.1 Hz digit
resolution.
4. Change the chamber temperature to 50°C.
5. When the chamber temperature and the MT8801C internal temperature re-stabilize, measure the
frequency using the MF1603A.
6. Calculate the stability using the following equation:
Frequency stability=
(MF1603A reading at 50˚C) – (MF1603A reading at 25˚C)
(MF1603A reading at 25˚C)
7. Change the chamber temperature to 0°C and repeat steps 5 and 6
Reference oscillator frequency stability
Agin rate
Temperature stability
–1.9 × 10
–8
–4.9 × 10
–8
Effective lower limit stability Effective lower limit Effective upper limit
____________
____________
+1.9 × 10
–8
+4.9 × 10
–8
±1 × 10
–9