54733-10BA2L
3 – 406 02.2017
6 Functional Processes Volume 3
6.2 Plateau Measurement
These parameters determine how the plateau measurement is to be
performed.
Below we will describe how to perform a plateau measurement. The
plateau measurement checks the function of the detector.
The radiation conditions must be constant while recording the pla-
teau!
Bild 6-1 Result of a plateau measurement
The plateau is the flat section of the curve and it is typically approx.
200V long (see also Volume 2, chapter 4.5). Please note that the
above characteristic curve and the following information is only
valid for a NaI detector. With a polymer scintillator the plateau is
steeper and may have to be qualified by a BERTHOLD service tech-
nician.
The crystal-multiplier assembly or the complete detector has to be
replaced if:
• the plateau is shorter than 50V
• the count rate changes by more than 5% per 100 Volt high volt-
age
During the plateau measurement the level measurement is held at
the last measured value.
100
200
300
400
500
600
700
800
900
1000
1100
I/s
HIGH VOLTAGE (V)
600
900 1200 1500
Plateau
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