54733-10BA2L
3 – 366 02.2017
Menu Structure Volume 3
2.38 Tes t
Menu path: Device Config Setup Service Test.
These menus allow you to perform various tests on the detector. All
tests have a direct influence and are not delayed by the time con-
stant.
If you lock the device with the password or if the Safety Mode is
enabled, all test settings will be disabled automatically.
1 Test Settings Opens the menu offering various test options for the detector (page
3-366).
2 I/O Test Settings Opens to the menu offering various test options for the digital inputs
and outputs (page 3-369).
2.39 Test Settings
Menu path: Device Config Setup Service Test Test
Settings.
This menu allows you to check your calibration setting by simulating
the measurement signal.
1 Level Mode Here you can check if the process value is correctly transmitted
from the field device to the process control system.
To simulate a level reading, you have to:
1. Enter a level value at Level.
2. Select FIXED VALUE at Level Mode.
After the test, do not forget to switch from FIXED VALUE back to
NORMAL; otherwise your measurement signal will remain frozen
at this value.
2 Level Enter the value to be simulated.
To enable the simulation, you must set FIXED VALUE at Level
Mode.
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