Chapter 7: Service and troubleshooting
218 EST3X Technical Reference Manual
nature of the trouble will appear in the Latching Troubles By Device Address
window on the Signature Series Status / Diagnostics, Device Troubles tab.
While on the Device Troubles tab, press F1 to open its Help topic, which provides
instructions and descriptions for the information provided.
Refer to Table 66 and Table 67 for a list of device trouble messages and their
possible causes, and possible solutions.
Table 66: Signature Series device trouble messages
Trouble tab message Possible cause Possible solution
External device line short
The detector is defective Replace the detector.
External device line open
The detector is defective Replace the detector.
The detector is dirty Clean the detector.
Device switched to short after
isolator relay operated
A short is detected on the
loop.
Locate and remove the cause of
the short.
• The detector is dirty.
• The ion chamber is bad.
• Clean the detector.
• Replace the detector.
• The detector is dirty.
• The ion chamber is bad.
• Clean the detector.
• Replace the detector.
• The detector is dirty.
• The ion chamber is bad.
• Clean the detector.
• Replace the detector.
Devices on the loop are
drawing too much current
during the mapping process.
Place a temporary short across
the data loop (approximately
5 seconds).
Devices on the loop are not
drawing enough current
during the mapping process.
• Check for defective wiring.
• Replace the device.
The relay base is bad. Replace the relay base.
External or isolator relay
failure to switch
The base is bad. Replace the base.
External or isolator relay
swi
tched
• The relay base is bad.
• External electrical noise
is present.
• Replace the relay base.
• Remove or shield the noise
source.
The base is bad. Replace the base.
-of-rise too high The ion chamber is bad. Replace the detector.
The detector is dirty. Clean the detector.
The detector is dirty. Clean the detector.
The detector is defective. Replace the detector.
The base is bad. Replace the base.