Measuring Waveforms
3-116
TDS5000 Series User Manual
Customized Measurements. Choose the measurement m ethod to control how your
waveform data is characterized. See High/Low Method on page 3--117 and
Reference Levels Method on page 3--117.
Statistics on Measurement Results. To see how automatic measurements vary
statistically, you can display the Min, Max, Mean, and Standard Deviation of the
measurement results. See Display measurement statistics on page 3--120 for
more information.
Measurement Param e ters. Select from an extensive range of parameters to
measure; for a list, see Appendix B: Automatic Measurements Supported.
Partial Waveform Measurements. By default, the oscilloscope takes each
automatic measurement over the entire waveform record, but you can use
measurement gates and Zoom to localize each measurement to a section of a
waveform (see Localizing a Measurement on page 3--122).
Take Measurements on a Frame. In FastFrame, measurements are taken only on
the displayed frame.
The following topics summarize how automatic measurements support your data
analysis tasks. All channel, reference, and math waveforms can serve as sources
for automatic measurements. Some measurements, such as Delay and Phase,
require two sources.
Measurement Categories. The following automatic measurement categories are
available: Amplitude, Time, More (miscellaneous), and optional Histogram.
Refer to Appendix B: Automatic Measurements Supported for a list of the
measurements you can choose from in each category.
Number of Measurements. The oscilloscope can take and update up to eight
measurements at one time. You can apply measurements to any combination of
sources. For example, you can take all eight measurements on Channel 1, or you
can take measurements on a combination of channel waveforms, math wave-
forms, reference waveforms, and/or optional histograms.
Using Automatic
Measurements
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