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Toshiba TECRA 9100 Series - Page 121

Toshiba TECRA 9100 Series
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3.5 Memory Test 3 Tests and Diagnostics
TECRA 9100 Maintenance Manual (960-347) 3-11
Subtest 06 Stress
The conventional memory is provided with a write/read buffer (size 1b30 h)
and creates write data in the write buffer. Subsequent to 1 MB, the data is
written in the write buffer and is read into the read buffer, followed by a data
comparison up to the maximum memory size.
Subtest 07 SPD Memory
This subtest displays the items indicated below for the Serial Presence Detest
(SPD) memory installed in each of the A and B slots.
Fundamental memory type
Voltage interface standard of this assembly
System frequency
Total memory

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