Hioki 8730-10 - Selecting a Test Mode

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8.4 Input Terminals
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8.4.4 Selecting a Test Mode <MODE3 to 0 Terminals (A9 to 12),
MODE_SET Terminal (A13)>
More than 1 ms
More than 1 ms
MODE3
～
0
More than 0 ms
Operation
BUSY
MODE_SET
More than 60 ms
More than 60 ms
Processing time: within 1 s
Measurable
condition
More than 60 ms
Loadin
g
MODE3 to 0
Measurement
is not being
conducted
More than 60 ms
More than 60 ms
More than 60 ms
Switching the test mode
Interval for
confirmation
O
p
eration
Measureable
Condition
An external signal may be used to change the test mode.
(For detailed information on test modes, see 5.2.4)
When the MODE_SET terminal (terminal No.: A13) detects the falling of
a signal (active LOW), the 8730-10, 8731-10 loads the 4-bit combination
of MODE3 to 0 (terminal Nos.: A9 to 12).
According to the 4-bit combination of MODE3 to 0, a setting (test mode)
saved is loaded to 8730-10, 8731-10 internal memory. See the table below
for the 4-bit combinations and corresponding test modes.
These terminals are effective when measurement is not being conducted.
While switching the test mode, the BUSY terminal (B10) indicates "L."
(Measurement cannot begin while the status of the BUSY terminal is "L.")
When the test mode is changed, the displayed waveform will be cleared.
Input Signal
The MODE_SET terminal (A13) will be shorted with EXT_COM terminal
(A3) or a low-level signal will be input to the terminal. The 4-bit
combination of MODE3 to 0 will be loaded at the falling edge.
<When using an internal power supply>
HIGH level voltage: Max.: 5.0 [V], Min.: 4.0 [V]
LOW level voltage : Max.: 1.0 [V], Min: 0 [V]
<When using an external power supply>
External power supply voltage V
EXT
: Max.: 30 [V] DC, Min.: 5 [V] DC
HIGH level voltage : Max.: V
EXT
[V], Min.: V
EXT
-1.0 [V]
LOW level voltage : Max.: 1.0 [V], Min.: 0 [V]
<Timing>