In this section:
Introduction .............................................................................. 6-1
Test sequences ........................................................................ 6-1
Test descriptions ...................................................................... 6-1
Configuring test sequences .................................................... 6-12
Introduction
This section contains detailed information on built-in test sequences available with the Keithley
Instruments Model 6517B Electrometer.
Test sequences
The Model 6517B has the following built-in test sequences:
Device characterization tests:
Diode leakage current
Capacitor leakage
Cable insulation resistance
Resistor voltage coefficient
Resistivity tests:
Normal (surface and volume)
Alternating polarity
Surface insulation resistance (SIR) test
Sweep tests:
Square wave
Staircase
Test descriptions
The following information describes each test, shows the connections to the Model 6517B, and
explains how to set up the Model 6517B for the measurements.
The results of a test are stored in the buffer. For example, if a test performs 10 measurements, those
10 readings are stored in the buffer at locations 0 through 9. If a test only performs one
measurement, that single reading is stored at memory location 0. Note that when a test is performed,
previous data stored in the buffer is lost.
Section 6
Test sequences
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