Keithley 6517B

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Section 14: SCPI command reference Model 6517B Electrometer Reference Manual

14-114 6517B-901-01 Rev. C / August 2015

Positive transition effect on arm event register

Arm event Positive transition effect on arm event register

Sequence 1 Sets B1 when in an arm layer

Figure 132: Arm transition filter

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Default Chapter3
- Safety Precautions3
- Table of Contents5
Getting Started17
- Welcome17
- Capabilities and Features Overview17
- Available Options and Accessories18
- Manual Addenda21
- Extended Warranty21
- Contact Information21
- CD-ROM Contents21
- General Ratings22
- Unpacking and Inspection22
Getting Started24
- Introduction24
- Front Panel Summary24
- Rear Panel Summary26
- Power-Up28
- Display31
- Navigating Menus40
  - Menu Types40
  - Navigation Rules40
- Menu41
Connections54
- Introduction54
- Electrometer Input Connector54
- Connection Methods57
- Low-Noise Cables, Shielding, and Guarding59
  - Low-Noise Input Cables60
  - Shielding and Guarding60
- Floating Circuits62
  - Floating Measurements63
  - Floating Voltage Source63
- Test Fixtures64
  - Keithley Instruments Model 8009 Test Fixture64
  - Custom Built Test Fixtures65
Basic Measurements69
- Introduction69
- Voltage Measurements69
- Current Measurements77
- Resistance and Resistivity Measurements86
- Charge Measurements (Q)99
- Other Measurement Considerations103
Measurement Options108
- Introduction108
- Voltage Source108
- Analog Outputs114
  - Analog Output115
  - Preamp out116
- Using External Feedback117
- Range and Resolution124
  - Measurement Range124
  - Display Resolution125
- Zero Check, Relative, and Zero Correct126
Test Sequences129
- Introduction129
- Test Descriptions129
- Configuring Test Sequences140
Triggering144
- Trigger Configuration Menu145
- Trigger Models146
- Trigger Configuration152
- External Triggering159
Buffer (Data Store)169
- Introduction169
- Buffer Overview169
  - Maximum Readings169
  - Data Elements169
- Configuring Data Storage171
Filters and Math177
- Introduction177
- Filters177
- Math183
Limits, Digital I/O, and Scanning188
- Introduction188
- Limits188
- Digital I/O193
- Scanning197
  - Internal Scanning197
  - External Scanning198
Remote Operations200
- Introduction200
  - Standards200
  - Serial Port200
- Connections200
  - IEEE-488 Bus Connections201
  - Interface Connections202
- Selecting Interface Parameters203
  - Communication Menu203
  - GPIB Primary Address Selection206
- General Bus Commands206
- IEEE-488 Front Panel Operation208
- Programming Syntax209
- IEEE-488 Trigger Model215
  - Idle and Initiate216
  - Trigger Model Layers216
- Serial Interface219
Common Commands223
- Introduction223
- Common Command Summary224
- Common Command Descriptions225
Status Structure238
- Introduction238
- Status Register Sets238
- Queues247
  - Output Queue247
  - Error Queue248
- Status Byte and Service Request (SRQ)248
SCPI Command Reference252
- Signal-Oriented Measurement Commands252
- SCPI Command Summary257
- SCPI Command Subsystems283
- Calculate Subsystem283
- Display Subsystem296
- Format Subsystem301
- Output Subsystems306
- Sense1 Subsystem308
- Source Subsystem339
- Route Subsystem344
- Status Subsystem350
- System Subsystem373
- Trace Subsystem387
- Trigger Subsystem395
- Tsequence Subsystem406
- UNIT Subsystem423
  - Temperature <Name423
Calibration Procedure424
- Introduction424
- Calibration Command Reference440
Verification Procedure454
- Introduction454
- Verification Procedures456
Accuracy Calculations470
- Introduction470
Interface Function Codes474
- Code Summary476
ASCII Character Codes476
- Introduction479
IEEE-488 Bus Overview479
- Bus Description480
- Bus Lines481
- Bus Commands484
IEEE-488 Conformance492
- Information493
SCPI Conformance497
- Introduction497

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