13Overview
2. Overview
This chapter contains general information about AT281x .The information is organized
as follows
Introduction
Main Specifications
Feature overview
2.1 Introduction
Thank you for purchasing AT281x LCR meter.
The Applent AT281x is a general-purpose LCR meter for incoming inspection of
components, quality control, and laboratory use.
The AT281x is used for evaluating LCR components, materials, and semiconductor
devices over a wide range of frequencies (10 Hz to 300 kHz) and test signal levels
(0.01Vrms to 2 Vrms).
With its built-in comparator, the AT281x can output comparison/decision results for
sorting components into a maximum of ten bins. Furthermore, by using the handler
interface, the AT281x can be easily combined with a component handler, and a system
controller to fully automate component testing, sorting, and quality-control data
processing.
The AT281x’s list sweep function permits entry of up to 10 frequencies or test signal
levels points to be automatically measured.
2.2 MainSpecificationsandFeatures
2.2.1 TestFunction
Cs-Rs, Cs-D, Cp-Rp, Cp-D, Lp-Rp, Lp-Q, Ls-Rs, Ls-Q, G-B, Rs-Q, Z-r, Z-d.
2.2.2 EquivalentCircuit
Serial and Parallel
Table2‐1 EquivalentCircuit
Circuit
Dissipation Factor
Conversion
L
Lp
Rp
D=2FLp/Rp=1/Q
Ls=Lp/(1+D
2
)
Rs=RpD
2
/(1+D
2
)
Lp Rp
D=Rs/2FLs=1/Q
Lp=(1+D
2
)Ls
Rp=(1+D
2
)Rs/D
2
C
Cp
Rp
D=1/2FCpRp=1/Q
Cs=(1+D
2
)Cp
Rs=RpD
2
/(1+D
2
)