Applent Instruments AT2818 - Page 9

9
Unpacking and Preparation
TableContents
Table 2-1  Equivalent Circuit .................................................................................................................... 13
Table 2-2 AT2818 AT2816A AT2816B AT2817A Measurement Range .................................................. 14
Table 2-2  AT2817 Measurement Range ................................................................................................. 14
Table 2-2  AT810A Measurement Range ................................................................................................ 15
Table 3-1 Front panel description ............................................................................................................ 17
Table 3-2 Real panel description .............................................................................................................. 18
Table 4-1 The combinations of measurement parameters ........................................................................ 20
Table 4-2 Monitor parameters .................................................................................................................. 21
Table 4-3 Impedance range mode ............................................................................................................ 22
Table 4-4 Effective measurement range for the impedance range when in HOLD state ......................... 22
Table 4-5 AT2818 Frequency range and test frequency point ................................................................. 23
Table 4-6 AT2816A Frequency range and test frequency point ............................................................... 23
Table 4-7 AT810A Frequency range and test frequency point ................................................................. 23
Table 4-8 AT2818’s Test Frequency that can be set using INCR++/DECR-- .......................................... 24
Table 4-9 AT2816X’s Test Frequency that can be set using INCR++/DECR-- ....................................... 24
Table 4-10 AT2818’s Test Frequency that can be set using INCR+/DECR- ............................................. 24
Table 4-11 AT2816X’s Test Frequency that can be set using INCR+/DECR- ........................................... 24
Table 4-12 AT2817A’s Test Frequency that can be set using INCR+/DECR- ........................................... 24
Table 4-13 AT2817’s Test Frequency that can be set using INCR+/DECR- ............................................. 24
Table 4-14 AT810A’s Test Frequency that can be set using INCR++/DECR-- ......................................... 24
Table 4-15 Test voltage Level that can be set with INCR++/DECR-- ....................................................... 26
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Table 4-16 Test voltage Level that can be set with INCR+/DECR- .......................................................... 26
Table 8-1 Description of Handler Interface Signals ................................................................................. 51
Table 8-2 Timing ...................................................................................................................................... 55
Table 10-1 RS-232 connector pinout ......................................................................................................... 59
Table 11-1 Multiplier Mnemonics ............................................................................................................. 69