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Models 2500 and 2502 User’s Manual Limit Testing 11-7

Pass condition

For this discussion, assume that all grading mode limit tests pass. After the three limit tests

pass, the PASS message is displayed, and operation drops down to the Binning Control

decision block. (Note that the pass condition can also be determined with the

:CALC7:LIM<n>FAIL? query via remote.)

Immediate binning — For immediate binning, the testing process stops. The Model 2500

outputs the pass pattern to the component handler to perform the binning operation.

End binning — For end binning, operation drops down to Another Test Cycle? decision

block. If programmed to perform additional tests (i.e., sweep) on the DUT package, oper-

ation loops back up to perform the next source-measure action. After all programmed test

cycles are successfully completed, the Model 2500 outputs the pass pattern to the compo-

nent handler to perform the binning operation.

If conﬁgured to test another DUT package, operation loops back to the top of the ﬂowchart

and waits for the start-of-test (SOT) pulse from the component handler.

Fail condition

When a failure occurs, the FAIL message is displayed (and can also be read via remote

with :CALC7:LIM<n>FAIL?), and operation proceeds to the Binning Control decision

block.

Immediate binning — For immediate binning, the testing process is terminated and the

fail pattern for that particular failure is sent to the component handler to perform the bin-

ning operation.

End binning — For end binning, the fail pattern for the ﬁrst failure is stored in memory

and operation proceeds to Another Test Cycle? decision block. If programmed to perform

additional tests (i.e., sweep) on the DUT package, operation loops back up to perform the

next source and measure action. Note that when a failure occurs, subsequent tests in the

test cycle are not performed.

After all programmed test cycles are completed, the Model 2500 outputs the fail pattern

stored in memory. This reﬂects the ﬁrst failure that occurred in the testing process for the

device package. The component handler places the DUT in the appropriate bin.

If conﬁgured to test another DUT package, operation loops to the top of the ﬂowchart and

waits for the start-of-test (SOT) pulse from the component handler.

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Keithley 2500 User Manual

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