11-18 Limit Testing Models 2500 and 2502 User’s Manual
Figure 11-10
Limits configuration menu tree
Performing limit tests
Perform the following steps to run limit tests:
Step 1. Configure test system.
As previously explained in Section 2, your test system could be as simple as connecting
one or two DUTs to the Model 2500 or could employ the use of a handler for binning
operations. Adding a scanner to the test system allows you to test multiple devices. Make
sure that the Digital I/O is configured appropriately for the handler you are using.
Step 2. Configure bias source and measure functions.
Configure the Model 2500 for the desired operations as follows:
1. Select the desired source channel by pressing SRC1 or SRC2.
2. Set the source level to the desired value.
3. Press MSR1 or MSR2 to select the desired measurement channel, then choose the
desired measurement range.
Refer to Section 3, “Basic Operation,” for more information.
Config
Limit
Digout
H/W
Limits 1,2
Mode
Size
Fail
Mode
Control
Auto
Clear
S/W
Limits
Pass
EOT
Mode
LIM3-6
Control
HILIM
LOLIM
/EOT
EOT
/BUSY
BUSY
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