93
Q.
Why am I encountering frequent contact errors and measurement reliability
errors?
A.
The instrument may not be properly acquiring the potential distribution. Possible causes include
cases in which measurement current pathways are not well-formed in the test area, for example
due to there being only a small amount of conductive auxiliary agent, or a mixture of locations
where there is conductive auxiliary agent and other locations where there is none. Enable the
error rejection function and repeat measurement. You may be able to obtain results that more
closely approach an accurate value by measuring multiple locations similarly and performing
statistical processing (averaging, variability, etc.) of the results.
Q.
Can I measure an electrode that has not yet been pressed?
A.
You may be able to do so, depending on the softness of the composite layer. Such
measurement is possible as long as the composite layer has a certain level of rmness,
regardless of whether it has been pressed. If the composite layer is too soft, the probes may
become embedded in the composite, resulting in a measurement reliability error or an analysis
reliability error.
Q.
Under what circumstances do contact errors occur? (p. 105)
A.
Contact errors are reported more often when the effect on measurement of the contact
resistance between the probes and the measurement target becomes more pronounced.
In terms of specic operation, 2-terminal resistance measurement is used to measure the
resistance between the probes and the measurement target, and a contact error is concluded
to have occurred if a certain threshold is exceeded.
Q.
What will happen if I use a PC with other than the recommended system
requirements?
A.
The system will function in most cases if you use a CPU that is not recommended (Intel
®
Core™ i7, 2.4 GHz, 4 threads or better), but PC application processing may slow.
8
FAQ
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