IRIG-B Connection
Connection ST multimode optical fiber G50 μm/125 μm, G62,5μm/125 μm
Electrical Tests
Regulations
Standards:
see also individual tests
Protection devices Bay units
IEC 60255
EN 60255-1
DIN EN 60255-26
IEC 61000-6-5
IEC/EN 61000-4
IEC 60694
IEC 61850-3
ANSI/IEEE Std C37.90
IEC 60255-27
VDE 0435
IEC 60870
EN 60870
DIN EN 60870
IEC TS 61000-6-5
IEC/EN 61000-4
IEC 60694
IEC 61850-3
Insulation Test
Standards:
IEC 60255-27 and IEC 60870-2-1
Voltage test (component test) all circuits except for
auxiliary voltage, binary inputs and communication
interfaces
2.5 kV, 50 Hz
Voltage test (component test) auxiliary voltage and
binary inputs
DC 3.5 kV
Voltage test (component test) only isolated
communication interfaces (A and B)
500 V, 50 Hz
Impulse voltage test (type test), all process circuits
(except for communication interfaces) against
internal electronics
6 kV (peak value);
1.2 µs/50 µs; 0.5 J;
3 positive and 3 negative impulses at intervals of 1 s
Impulse voltage test (type test), all process circuits
(except for communication interfaces) against each
other and against the grounding terminal category
III
5 kV (peak value);
1.2 µs/50 µs; 0.5 J;
3 positive and 3 negative impulses at intervals of 1 s
EMC Tests for Immunity (Type Tests)
Standards:
IEC 60255-1 and -26, (product standards)
IEC/EN 61000-6-2
VDE 0435
For additional standards,
see the individual tests
Damped oscillatory wave
100 kHz (1 MHz); 3MHz, 10 MHz
IEC 60255-26, IEC 61000-4-18, IEEE C37.90.1
2.5 kV (peak); 1 MHz; τ = 15 µs;
100 kHz 40 pulses per s; 1 MHz 100
pulses per s; 3/10 MHz 5000 pulses per s
test duration 60 s;
R
i
= 200 Ω
4.1.5
Technical Data
4.1 General Device Data
504 SIPROTEC Compact, 7SC80, Manual
E50417-G1140-C486-A8, Edition 07.2017
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