Texas Instruments TMS320F2837 D Series Workshop Guide And Lab Manual

Comparator Subsystem (CMPSS)
TMS320F2837xD Microcontroller Workshop - Analog Subsystem 6 - 23
Comparator Subsystem Block Diagram
Comparator Subsystem Block Diagram
DACxVALA * DACREF
4096
V
DACx
=
DAC Reference Comparator Truth Table
Voltages Output
Voltage A < Voltage B 0
Voltage A > Voltage B 1
+
COMPH
-
Digital
Filter
12-bit
DAC
1
0
CTRIPH
to EPwm
X-Bar
0
1
CTRIPOUTH
to Output
X-Bar
DACH
VALA
0
1
DACH
VALS
+
COMPL
-
Digital
Filter
12-bit
DAC
1
0
0
1
DACL
VALA
DACL
VALS
ePWM
Event
Trigger
&
GPIO
MUX
CMPINxP
CMPINxN
COMPHINV
COMPLINV
COMPDACE
COMPHSOURCE
COMPLSOURCE
DACSOURCE
CTRIPL
to EPwm
X-Bar
CTRIPOUTL
to Output
X-Bar
Note: registers lock protected
Each CMPSS module is designed around a pair of analog comparators which generates a digital
output indicating if the voltage on the positive input is greater than the voltage on the negative
input. The positive input to the comparator is always driven from an external pin. The negative
input can be driven by either an external pin or an internal programmable 12-bit digital-to-analog
(DAC) as a reference voltage. Values written to the DAC can take effect immediately or be
synchronized with ePWM events. A falling-ramp generator is optionally available to the control
the internal DAC reference value for one comparator in the module. Each comparator output is
feed through a programmable digital filter that can remove spurious trip signals. The output of the
CMPSS generates trip signals to the ePWM event trigger submodule and GPIO structure.

Texas Instruments TMS320F2837 D Series Specifications

General

Brand	Texas Instruments
Model	TMS320F2837 D Series
Category	Microcontrollers
Language	English