Texas Instruments TMS320F2837 D Series Workshop Guide And Lab Manual

ePWM
7 - 30 TMS320F2837xD Microcontroller Workshop - Control Peripherals
ePWM Trip-Zone and Digital Compare Sub-Modules
ePWM Trip-Zone and Digital Compare
Sub-Modules
16-Bit
Time-Base
Counter
Compare
Logic
Action
Qualifier
Dead
Band
PWM
Chopper
Trip
Zone
Period
Register
Clock
Prescaler
EPWMxA
EPWMxB
TZy
EPWMxSYNCI EPWMxSYNCO
TBCLK
Digital
Compare
Compare
Registers
Event Trigger
Compare
Registers
INPUT X-Bar
ePWM X-Bar
TZ1-TZ3
EPWMCLK
The trip zone and digital compare sub-modules provide a protection mechanism to protect the
output pins from abnormalities, such as over-voltage, over-current, and excessive temperature
rise.
Trip-Zone Features
 Trip-Zone has a fast, clock independent logic path to high-impedance
the EPWMxA/B output pins
 Interrupt latency may not protect hardware when responding to over
current conditions or short-circuits through ISR software
 Supports: #1) one-shot trip for major short circuits or over
current conditions
#2) cycle-by-cycle trip for current limiting operation
CPU
core
P
W
M
O
U
T
P
U
T
S
EPWMxTZINT
TZ6
TZ5
TZ4
INPUT X-Bar
ePWM X-Bar
Cycle-by-Cycle
Mode
One-Shot
Mode
EPWMxA
EPWMxB
Digital
Compare
CPU
SYSCTRL
eQEP1
EMUSTOP
CLOCKFAIL
EQEP1ERR
Over
Current
Sensors
TZ1 – TZ3

Texas Instruments TMS320F2837 D Series Specifications

General

Brand	Texas Instruments
Model	TMS320F2837 D Series
Category	Microcontrollers
Language	English