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Texas Instruments TMS320F2837 D Series Workshop Guide And Lab Manual

Texas Instruments TMS320F2837 D Series
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Emulation and Analysis Block
TMS320F2837xD Microcontroller Workshop - System Design 10 - 3
Emulation and Analysis Block
JTAG Emulation System
(based on IEEE 1149.1 Boundary Scan Standard)
Some Available Debug Probes
XDS100 CLASS -
BlackHawk: USB100
Spectrum Digital: XDS100
XDS200 CLASS -
BlackHawk: USB200
Spectrum Digital: XDS200
These debug probes offer a balance of low
cost with good performance compared to the
XDS100 class debug probes
These debug probes are ultra-low cost, and
have an unlimited free license for use with
Code Composer Studio
H
E
A
D
E
R
System Under Test
SCAN IN
SCAN OUT
Debug
Probe
TMS320C2000
Note: XDS510 CLASS debug probes are not recommended (obsolete); and for C2000, XDS560 CLASS debug
probes are not recommended since they are expensive and do not offer any advantage over the XDS200
CLASS debug probes
Emulation Connections to the Device
TRST
TMS
TDI
TDO
TCK
EMU0
EMU1
TRST
TMS
TDI
TDO
TCK
TCK_RET
13
14
2
1
3
7
11
9
GND
PD
Vcc (3.3 V)
GND
GND
GND
GND
GND
5
4
6
8
10
12
Vcc (3.3 V)
TMS320F28x7x Debug Header
= If distance between device and header is greater than 6 inches
GND

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Texas Instruments TMS320F2837 D Series Specifications

General IconGeneral
BrandTexas Instruments
ModelTMS320F2837 D Series
CategoryMicrocontrollers
LanguageEnglish

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