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Alcatel-Lucent 7750 SR - ETH Test Function

Alcatel-Lucent 7750 SR
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Services
7750 SR OS Services Guide Page 113
Drop Eligibility — Frames with ETH-AIS information are always marked as drop
ineligible.
A MIP is transparent to frames with ETH-AIS information and therefore does not require any
information to support ETH-AIS functionality.
ETH Test Function
The Ethernet test signal function (ETH-Test) is used to perform one way on-demand in-service or
out-of-service diagnostics tests. This includes verifying bandwidth throughput, frame loss, bit
errors, etc.
When configured to perform such tests, a MEP inserts frames with ETH-test information with
specified throughput, frame size and transmission patterns.
When an in-service ETH-test function is performed, data traffic is not disrupted and the frames
with ETH-Test information are transmitted in such a manner that limited part of the service
bandwidth is utilized. This rate of transmission for frames with ETH-test information is pre-
determined for in-service ETH-test function.
Specific configuration information required by a MEP to support ETH-test is the following:
MEG level — MEG level at which the MEP exists
Unicast MAC address of the peer MEP for which ETH-test is intended.
Data - Optional element whose length and contents are configurable at the MEP. The
contents can be a test pattern and an optional checksum. Examples of test patterns include
pseudorandom bit sequence (PRBS) (2^31-1) as specified in sub-clause 5.8/O.150, all “0”
pattern, etc. At the transmitting MEP, configuration is required for a test signal generator
which is associated with the MEP. At a receiving MEP, configuration is required for a test
signal detector which is associated with the MEP.
Priority — Identifies the priority of frames with ETH-Test information.
Drop Eligibility — Identifies the eligibility of frames with ETHTest information to be
dropped when congestion conditions are encountered.
A MIP is transparent to the frames with ETH-Test information and therefore does not require any
configuration information to support ETH-Test functionality.
A MEP inserts frames with ETH-Test information towards a targeted peer MEP. The receiving
MEP detects these frames with ETH-Test information and makes the intended measurements.
Time stamping is performed by the CPM P-chip to ensure accuracy on multi-slot chassis.

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