histogram, 10-36
transition time, 9-3
with markers, 11-59
Vp-p, 7-14
measurement, 7-4, 7-7
Vpp softkey, 8-9
Vrms cycle, 7-11
Vrms softkey, 8-10
Vtop, 7-14
measurement, 7-9
Vtop softkey, 8-10
Vupper (dene measure) softkey, 10-11
Vupper (general meas) softkey, 8-13
W
warranty
information,
xii
waveform
annotation,
11-34
conformance,
5-34
data
display,
1-12
,
2-7
le
format,
11-14
histogram,
10-6
jitter
measurement,
10-36
marker
display,
1-12
markers,
11-59
measurement,
9-19
measurement
process,
7-4
{13
measurement
repeatability,
10-4
memory, 6-29
, 11-23
menu
overview,
11-93
noise
measurement,
10-36
noise reduction,
10-4
non-symmetrical,
8-3
period measurement, 7-13
position, 5-5, 5-28
record display, 1-13
resolution improvement, 10-4
tolerance, 6-8
Waveform (disk) softkey, 11-11
W
aveform
(display)
softkey, 11-33
W
aveform
(histogram)
softkey,
10-40
waveform
memory, 11-55
Waveform
menu, 11-93{98
Waveforms (limit test) softkey, 11-48
Waveforms
(mask test) softkey, 6-24
waveform (waveform) softkey, 11-94
+width
softkey, 8-6
+Width timing measurement, 7-18
window
Index-25