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Andor Technology iKon-L - Offset; Rayleigh Wavelength

Andor Technology iKon-L
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CALIBRATION
iKon-L SECTION 8
Page 147
8.3.1.7 - Offset
By entering a value in the Offset text box of the Spectrograph X-Calibration dialog box you can compensate for
small misalignments of the detector or the wavelength drive in your spectrograph. A positive value will cause
the x-axis of the data window to move to the right (relative to the trace) by the corresponding number of pixels.
A negative value will cause the x-axis to move to the left.
NOTE: To assess the accuracy of any calibration you have performed, you will need a calibration
spectral line source, such as a helium neon laser or a mercury vapor lamp. Ideally, set the spectrograph
to one of the prominent spectral lines, take a scan and use the cursor on the data window to determine
any offset (in pixels) of the line from its true wavelength.
8.3.1.8 - Rayleigh Wavelength
If you have selected Raman Shift as your X-Axis Label, you must enter a value in nanometers for the Rayleigh
Wavelength. In Raman Spectroscopy the Rayleigh Wavelength is that element of a spectrum line (in scattered
radiation) whose wavelength is equal to that of the incident radiation (i.e. the laser wavelength) and is a product
of ordinary or Rayleigh scattering.
An error message will appear if you attempt to perform a calibration without having entered a valid Rayleigh
Wavelength, e.g.:

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