Texas Instruments TMS320F2837 D Series Workshop Guide And Lab Manual

ePWM
TMS320F2837xD Microcontroller Workshop - Control Peripherals 7 - 33
Purpose of the Digital Compare
Sub-Module

Generates ‘compare’ events that can:
 Trip the ePWM
 Generate a Trip interrupt
 Sync the ePWM
 Generate an ADC start of conversion
 Digital compare module inputs are:
 Input X-Bar
 ePWM X-Bar
 Trip-zone input pins
 A compare event is generated when one or more
of its selected inputs are either high or low
 Optional ‘Blanking’ can be used to temporarily
disable the compare action in alignment with
PWM switching to eliminate noise effects
Digital Compare Sub-Module Signals
Digital Trip
Event A1
Compare
Digital Trip
Event A2
Compare
Digital Trip
Event B1
Compare
Digital Trip
Event B2
Compare
Generate PWM Sync
Time-Base Sub-Module
Generate SOCA
Event-Trigger Sub-Module
Trip PWMA Output
Generate Trip Interrupt
Trip-Zone Sub-Module
Generate PWM Sync
Time-Base Sub-Module
Generate SOCB
Event-Trigger Sub-Module
Trip PWMB Output
Generate Trip Interrupt
Trip-Zone Sub-Module
DCAH
DCAL
DCBH
DCBL
DCTRIPSEL TZDCSEL DCACTL / DCBCTL
DCAEVT1
DCAEVT2
DCBEVT1
DCBEVT2
blanking
blanking
TRIPIN1 & TZ1
TRIPIN2 & TZ2
TRIPIN3 & TZ3
TRIPIN4
TRIPIN12
TRIPIN15
TRIPIN14
TRIP COMBO
●
●
●
The digital-compare subsystem compares signals external to the ePWM module, such as a signal
from the CMPSS analog comparators, to directly generate PWM events or actions which are then
used by the trip-zone, time-base, and event-trigger submodules. These ‘compare’ events can trip
the ePWM module, generate a trip interrupt, sync the ePWM module, or generate an ADC start of

Texas Instruments TMS320F2837 D Series Specifications

General

Brand	Texas Instruments
Model	TMS320F2837 D Series
Category	Microcontrollers
Language	English