Keysight B2980B Series User Manual

180 Keysight B2980B User’s Guide, Edition 1
Front Panel Reference
Function Key Group
Values of GPIO Pins, /BUSY, /SOT, and /EOT
0 to 7 (integer). Numbers 1 to 7 indicate the DIO pins 1 to 7, respectively. 0
indicates that it is not used.
For GPIO Pins, multiple continuous pins are assigned. For example, “1, 2, 3, 4”
indicates that the DIO pins 1 to 4 are assigned. Then LSB is DIO pin 1.
Limit Test Setup Dialog Box
This dialog box provides the following parameters for setting the data
configuration of the limit test.
Feed Data Type of data used for the pass/fail judgement of the limit test,
AMPS, COUL., VOLTS, OHMS, or MATH.
AMPS: Current measurement data
COULS.: Charge measurement data (B2985B/B2987B)
VOLTS: Voltage measurement data (B2985B/B2987B)
OHMS: Resistance data (B2985B/B2987B)
MATH: Calculation result data of math expression
Test Index Index of limit test, No. 1 to 12.
The index numbers 1 to 12 are associated with the bin numbers
1 to 12. See “Limit Test Result Dialog Box” on page 185.
Limit Test Limit test for data specified by the Feed Data and Test Index
parameters, ON or OFF
Function Test mode, LIMIT is always displayed.
Pass Pattern Bit pattern for the limit test pass state. For the SORTING mode.
Up Pattern Bit pattern for the failed-by-exceeding-upper-limit state. Used
for the GRADING mode.
Up Limit Upper limit for the pass/fail judgement. Used for the GRADING
mode.
Low Pattern Bit pattern for the failed-by-exceeding-lower-limit state. Used
for the GRADING mode.

Keysight B2980B Series Specifications

General

Brand	Keysight
Model	B2980B Series
Category	Measuring Instruments
Language	English