Keysight B2980B Series - Page 179

Keysight B2980B User’s Guide, Edition 1 179
Front Panel Reference
Function Key Group
SORTING (SORT): Sorting mode. See Figure 5-8 for the
operation.
Auto Clear Automatic clear of the composite limit test result, ON or OFF
If this parameter is ON, the composite limit test results and the
DIO lines are automatically cleared.
Update Only for the GRADING mode. Test result output timing,
IMMEDIATE (IMM.) or END. See “Immediate?” shown in Figure
5-7.
IMMEDIATE (IMM.): Output after every test (Immediate? Yes)
END: Output after the last test (Immediate? No)
Offset Cancel Offset cancel, ON or OFF
If this parameter is ON, the data for the limit test judgement
will be as follows.
Data for judgement = measurement data  offset value
Offset Offset value used for the offset cancel, 9.999999E20 to
9.999999E20
Pass Pattern Bit pattern for the limit test pass state. For the GRADING mode.
Fail Pattern Bit pattern for the limit test fail state. For the SORTING mode.
GPIO Pins Displays the DIO pins assigned to the bit pattern output. To set
the pins, use the :CALC:DIG:BIT command.
/BUSY DIO pin assigned to the BUSY (busy) signal output
/SOT DIO pin assigned to the SOT (start of test) signal input
/EOT DIO pin assigned to the EOT (end of test) signal output
For the DIO pin assignment, see “Using Digital I/O and Trigger In/Out” on
page 78.
DIO pins assigned to the GPIO Pins, /BUSY, /SOT, or /EOT must be set to the
DIGITAL I/O function by using the DIO Configuration Dialog Box.