Keysight B2980B User’s Guide, Edition 1 229
Function Details
Limit Test
Limit Test
Limit test is a pass/fail judgment performed for a measurement data or math
result data obtained by a channel. It can be performed if both individual limit test
and composite limit test are set to ON. Maximum of twelve limit tests can be
defined and used for the bins of composite limit test.
Composite limit test supports the following two operation modes.
• Grading mode
Performs limit test for up to 12 test limits (bins) until a failure is detected. See
Figure 5-7 for an example flowchart.
• Sorting mode
Performs limit test for up to 12 test limits (bins) until a pass is detected. See
Figure 5-8 for an example flowchart.
It also supports the following communication functionality via the Digital I/O
connector and can classify test devices using the component handler.
• Receiving the SOT (start of test) strobe pulse
• Transmitting the EOT (end of test) strobe pulse
• Transmitting the BUSY signal
• Transmitting the bit pattern to show a pass/fail judgement result
In the figures, SOT is the start-of-test strobe pulse sent by the component handler
connected to B2980 via the Digital I/O connector.
To set the composite limit test, see “Composite Limit Test Setup Dialog Box” on
page 178.
To set the individual limit tests, see “Limit Test Setup Dialog Box” on page 180.
The composite limit test result Pass or Fail is displayed with the measurement
result data on the Meter view. To display the limit test result log, see “Limit Test
Result Dialog Box” on page 185.
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