Keysight B2980B User’s Guide, Edition 1 233
Function Details
Trace Buffer
Trace Buffer
The trace buffer collects the test result data until a full buffer is detected. The
maximum data size is 100,000 blocks. The data flow is shown in Figure 5-9. One
data block may contain multiple data, such as current measurement data, charge
measurement data, voltage measurement data, resistance measurement data,
voltage source output data, calculation result data, limit test data, time data,
temperature data, humidity data, and status data. They are selected by using the
Format keys of the I/O key group. See “I/O Key Group” on page 190.
For setting the trace buffer, see “Trace Buffer Setup Dialog Box” on page 181.
In Figure 5-9, the variables indicate the following data.
• VOLT: Voltage measurement data (B2985B/B2987B)
• CURR: Current measurement data
• CHAR: Charge measurement data (B2985B/B2987B)
• RES: Resistance measurement data (B2985B/B2987B)
• TIME: Time data (timestamp of the measurement start trigger)
• STAT: Status data or limit test status
• SOUR: Voltage source output data (B2985B/B2987B)
• CALC: Math (calculation) result data or limit test data (= raw data offset data)
• TEMP: Temperature data (B2985B/B2987B)
• HUM: Humidity data (B2985B/B2987B)
If data is stored in the trace buffer, its statistical data can be calculated.
Calculable statistical data is as follows.
• MEAN: Mean value
• SDEV: Standard deviation
• MIN: Minimum value
• MAX: Maximum value
• PKPK: Peak to peak value