Keysight B2980B User’s Guide, Edition 1 181
Front Panel Reference
Function Key Group
Low Limit Lower limit for the pass/fail judgement. Used for the GRADING
mode.
Bit pattern is sent to the DIO pins specified by the GPIO Pins field on the
Composite Limit Test Setup dialog box.
Trace Buffer Setup Dialog Box
This dialog box provides the following parameters for setting the trace function.
The data specified by the Feed Data parameter can be stored in the trace buffer if
the Buffer Control parameter is NEXT. The maximum data size is specified by the
Buffer Size parameter. See Figure 5-9 on page 235 for the trace buffer.
Feed Data Type of data placed in the trace buffer, SENSE, MATH, or LIMIT
SENSE: Measurement result data
MATH: Calculation result data of math expression
LIMIT: Limit test data
The data contains the current measurement data, calculation
result data, limit test data, time data, and status data selected
by using the Format keys of the I/O key group. See “I/O Key
Group” on page 190.
On the B2985B/B2987B, the data contains the charge
measurement data, voltage measurement data, resistance
measurement data, voltage source output data, temperature
data, and humidity data in addition to above.
Buffer Control Trace buffer control mode, NEVER or NEXT
NEVER: Disables the write operation to the trace buffer.
NEXT: Enables the write operation until buffer full.
Buffer full will change the mode to NEVER.
Buffer Size Size of the trace buffer, 1 to 100000 data
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