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MICRO-EPSILON optoNCDT 2300 - Page 52

MICRO-EPSILON optoNCDT 2300
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Page 52
Operation
optoNCDT 2300
Linearization diffuse
measurement arrangement,
laser power 1 mW
Linearization direct measurement arrangement,
laser power switchable
Refractive index correction
Direct
displacement measurement
Diffuse
displacement measurement
Direct
thickness measurement
Measurement program
Displacement measurement
highest peak, peak with the largest surface, 1. peak
Average
selected displacement
Setting masters / zeroing
selected peak
Statistics calculation for
displacement
Average
thickness & 1. & 2. displacement
Thickness measurement
thickness, 1. & 2. peak
Setting masters / zeroing
thickness
Statistics calculation for
thickness
Thickness measurement on direct
reflecting transparent targets
Displacement measurement on
diffuse reflecting targets
Displacement measurement
on direct reflecting targets
Fig. 28 Adjustment possibilities of the optoNCDT 2300

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