Instron CEAST 9340 - Modify Parameters

Page 52 - CEAST 9340 - Instructions for Use and Maintenance 7510.000MN1r ed. 1 rev. 1
Vid. 1.3 a - “Parameters“
8.5.5 MODIFY PARAMETERS
04 yyyyyyyyyyyyyyy04 yyyyyyyyyyyyyyy
04 yyyyyyyyyyyyyyy04 yyyyyyyyyyyyyyy
04 yyyyyyyyyyyyyyy
SUPPORT TYPESUPPORT TYPE
SUPPORT TYPESUPPORT TYPE
SUPPORT TYPE
FF
FF
F
SP. CLAMPINGSP. CLAMPING
SP. CLAMPINGSP. CLAMPING
SP. CLAMPING
DD
DD
D
INPUT H/V/EINPUT H/V/E
INPUT H/V/EINPUT H/V/E
INPUT H/V/E
HH
HH
H
CONDITIONINGCONDITIONING
CONDITIONINGCONDITIONING
CONDITIONING
NN
NN
N
ANTIREBOUNDANTIREBOUND
ANTIREBOUNDANTIREBOUND
ANTIREBOUND
NN
NN
N
OTHER PARAM.OTHER PARAM.
OTHER PARAM.OTHER PARAM.
OTHER PARAM.
>
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2
3
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5
Allows the input and modification of the current parameters group. The access is al-
lowed for the user level or higher.
Description of the parameters from (1) to (8):
1) Identify the parameters group last loaded from the menu “Load Parameters” (Vid.
1.2). The field is modifiable: the name entered will be that visualized in the “Param-
eters groups” list, if the current file will be saved.
2) “Support Type”: it select the type of specimen support (F or V) installed in the test
chamber.
F: fixed height (see para. 8.6.1 Fig. 1);
V: adjustable height (see para. 8.6.2 Fig. 2).
3) “Sp. Clamping”: enable or disables the operation of specimen clamping plate in
three different ways.
D: clamping plate disabled (the specimen is not clamped during the test);
Note: if the clamping plate has been manually operated by the “Clamp” key
before starting the test, the specimen remains clamped until the test is
done. The clamping plate goes up when the test ends and it remains
disabled.
C: clamping plate enabled during the test (the specimen is clamped before test and
unclamped after test).
When the environmental chamber door is open for the specimen replacement,
the systems inside the chamber are switched-off.
When the door is closed again, the systems inside the environmental chamber
will be switched-on after a few seconds.
I: clamping plate enabled during the test (the specimen is clamped before test
and unclamped after test).
This is the
suggested condition for tests at low temperature on films.
When the environmental chamber door is open for the specimen replacement,
the systems inside the chamber are switched-off.
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