With the DUT turned on, scan the DUT with the
EMI-E probe parallel to the DUT. The response of
the probe from the DUT may fluctuate based on a
number of different factors:
The position of the probe
The position of the DUT
The operating state of the DUT
The size of the probe used
The testing frequency/bandwidth of the
applied standard
2. Press Correction[F1] and choose whether to
view the near-field test results as is or the
simulated radiated results based on the near-
field test.
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