Hioki 3197 - Event Specifications

8.3 Event Specifications
150
8.3 Event Specifications
Event Type
Voltage Swell, Volt-
age Dip, Interruption
Measurement
method
Detection using voltage (½) measured every half cycle
Detected event
types
Voltage Swell: Maximum voltage (worst value),
occurrence time, recovery time, period
Voltage Dip: Residual voltage (worst value), occurrence
ti
me, recovery time, period)
Interruption: Residual voltage voltage, detection date/
ti
me, recovery date/time
, period
Threshold Swell: 100 to 150% of nominal voltage
Dip, Interruption:
0 to 100% of nominal voltage
Hysteresis 2% of nominal voltage
Recording
contents
Event data, event waveform, event voltage fluctuation
graph
Event data format Event number, date, time, event type, channel, status
(EVENT IN (Onset) / EVENT OUT (Recovery), period,
worst value
Inrush Current
Measurement
method
Detection using current (1/2) every half cycle
Detected event
types
Maximum current (worst value), detection time
Threshold 0 A to 5000 A (independent of current range and CT
ratio)
Recording
contents
Event data, event waveform, inrush current graph
Event data format Event number, date, time, event type
Transient
Overvoltage
Measurement
method
Comparator
Detection criteria Displays whether a positive or negative transient exists
during every voltage cycle on any of
three channels
Transient detec-
tion range
50 Vrms (±70.7 Vpeak equiv.) or more, 10 to 100 kHz
Recording
contents
Event Data, Event waveform
Event data format Event number, date, time, event type, status (EVENT IN
(Onset) / EVENT OUT (Recovery), continuation period