130
────────────────────────────────────────────────────
10.7 Example of Advanced Measurements
────────────────────────────────────────────────────
0.7 Example of Advanced Measurements
■ Measuring Contact Resistance at High Speeds
The 3560 supports a sampling rate of 50 samples per second (around 50
Hz) or 60 samples per second (around 60 Hz). The instrument supports
an analog response of about 100 ms (in 50 Hz area) or 84 ms (in 60 Hz
area), with response time varying with the object measured. Note that
these specifications are based on the FAST sampling rate. For maximum
performance, we recommend using the hold and trigger functions. For
more information on these functions, see Section 4.3.3 "Hold" and
Chapter 6 "External Control Terminal and External Output Terminal."
For high-speed measurement, the permissible measurement range should
not be reduced excessively in the comparator setting. In other words,
setting a wide measurement range is preferable as long as the nature of
the object to be measured in taken into consideration.
■ Measuring the Internal Resistance and Circuit Voltage of a Battery
Use the resistance and voltage mode. For more information on resistance
and voltage mode, see Chapter 4 "Measurement Procedure."
In resistance and voltage mode, resistance and voltage are both subject to
comparator operation.
To Next Page
Loading...
