1220 Infinity II LC System User Manual 183
Test Functions and Calibration
9
Diode Array Detector (DAD)
ASTM Noise Test
The ASTM noise test determines the detector noise over a period of 20
minutes. The test is done with the flowcell removed, so the test results are not
influenced by solvent or pump effects. On completion of the test, the noise
result is displayed automatically.
ASTM Noise Test Evaluation
Limit is ± 0.02 mAU
Test Failed
Cell Test
The cell test measures the intensity of the deuterium and tungsten lamps over
the full wavelength range (190 – 950 nm), once with the flow cell installed, and
once with the flow cell removed. The resulting intensity ratio is a measure of
the amount of light absorbed by the flow cell. The test can be used to check for
dirty or contaminated flow cell windows. When the test is started, the 1-nm
slit is moved into the light path automatically, and the gain is set to zero. To
eliminate effects due to absorbing solvents, the test should be done with water
in the flow cell.
This test is part of the detector self test only, see “Self-test” on page 171.
Probable cause Suggested actions
1
Insufficient lamp warm-up time
Allow lamp to warm-up for at least 1 hour.
2
Old or non-Agilent lamp.
Exchange the lamp.
This test should be performed inititially with a new detector/flow cell. The values should
be kept for later reference/comparison.
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