2-12 | IPS-4 Dual Bench (UV / IR) Analyzer
I
E
C
E
x
C
e
r
t
i
f
i
c
a
t
e
o
f
C
o
n
f
o
r
m
i
t
y
I
N
T
E
R
N
A
T
I
O
N
A
L
E
L
E
C
T
R
O
T
E
C
H
N
I
C
A
L
C
O
M
M
I
S
S
I
O
N
I
E
C
C
e
r
t
i
f
i
c
a
t
i
o
n
S
c
h
e
m
e
f
o
r
E
x
p
l
o
s
i
v
e
A
t
m
o
s
p
h
e
r
e
s
for rules and details of the IECEx Scheme visit www.iecex.com
Certificate No.: IECEx ETL 16.0044X Issue No: 0 Certificate history:
Issue No. 0 (2016-11-10)
Status: C
u
r
r
e
n
t
Date of Issue: 2
0
1
6
-
1
1
-
1
0
Applicant: A
M
E
T
E
K
P
r
o
c
e
s
s
I
n
s
t
r
u
m
e
n
t
s
455 Corporate Blvd
Newark, DE 19702
U
n
i
t
e
d
S
t
a
t
e
s
o
f
A
m
e
r
i
c
a
Equipment: D
u
a
l
B
e
n
c
h
P
r
o
c
e
s
s
S
p
e
c
t
r
o
p
h
o
t
o
m
e
t
e
r
Optional accessory:
Type of Protection: E
x
d
f
l
a
m
e
p
r
o
o
f
a
n
d
E
x
p
x
P
r
e
s
s
u
r
i
z
a
t
i
o
n
Marking:
Ex d px IIC T3 Gb IP 65
-20ºC to +50ºC
IECEx ETL 16.0044X
Approved for issue on behalf of the IECEx
Certification Body:
Don Card
Position:
Certification Officer
Signature:
(for printed version)
Date:
1. This certificate and schedule may only be reproduced in full.
2. This certificate is not transferable and remains the property of the issuing body.
3. The Status and authenticity of this certificate may be verified by visiting the Official IECEx Website.
Certificate issued by:
I
n
t
e
r
t
e
k
3
9
3
3
U
S
R
o
u
t
e
1
1
S
o
u
t
h
C
o
r
t
l
a
n
d
N
Y
1
3
0
4
5
-
2
9
9
5
U
n
i
t
e
d
S
t
a
t
e
s
o
f
A
m
e
r
i
c
a
Page 1 of
2016-11-10